Facilities
The Centre for Device Thermography and Reliability has a range of equipment that it uses in its research, operating a number of different laboratories with devices for high resolution thermal imaging as well as Infra-red Thermography and thermal simulation. Recent additions include a XT-ray and CT scanner, and a metal organic vapour phase epitaxy (MOCVD) growth equipment. All devices are available to researchers across the university and external users.
Laboratories
Listed below are the Centre for Device Thermography and Reliability's laboratories with accompaning photographs of lab spaces and equipment.
This laboratory is equiped with a Nikon XTV 160 XT-ray and CT Scanner, an Auriga’s pulsed IV/RF characterization system, a Low leakage measurement system, cryogenic system, Electroluminescence (EL), Hall measurement aparatus, equipment to measure capacitance and high voltage in devices and various microscopes.
Laboratory equiped with a Micro-Raman spectrometer and Nanosecond thermoreflectance system.
This facility operates an electric field induced second harmonic generation (EFISHG), which allows electrically controlling nonlinear light-matter interactions, essential in emerging integrated photonics applications.
This laboratory houses a state-of-the art metal organic vapour phase epitaxy (MOCVD) growth equipment Agnitron Agilis 100.
This facility houses an Atomic Force Microscope (AFM), high temperature stage and a Nanoindenter.
New Nikon X-ray and CT Scanner
The CDTR is operating a new Nikon XTV 160 XT-ray and CT Scanner donated by Fasetto. This new tool supports CDTR’s research in electronics reliability, in particular device and PCB inspection for failure analysis. Professor Martin Kuball said “This will not only advance our research but also aid us in the training of the next generation of semiconductor device engineers, and is accessible to researchers across the School of Physics as well as throughout the university and external users."