Devices, electronics and semiconductors
We test, diagnose faults and carry out repairs on computer chips, data storage chips or any electronic device that operates on a micro or even nanoscale need to using delicate, accurate ion beams and electron microscopes.
Get in touch
If you would like to discuss a materials analysis problem or a potential research collaboration, get in touch to see how we can help.
Using FIB in an efficient Dual Beam instrument that also has SEM and TEM allows a comprehensive, complete analysis and efficient problem-solving, without having to prepare the sample for three or four different machines.
Serial sectioning, electrical conductivity, nano-scale imaging, or even 3D modelling of small devices and structures are just some of our capabilities in this sector.
My knowledge of the CIF’s expertise in imaging bioinorganic nanostructures led me to select the CIF over other facilities in the UK – Endomag had a unique problem that needed imaging resources quickly and reliably, and the CIF delivered.
